MTD clients are agnostic of FLASH which needs ECC suppport.
Remove the functions and fixup the callers.
Signed-off-by: Thomas Gleixner <tglx@linutronix.de>
At least two flashes exists that have the concept of a minimum write unit,
similar to NAND pages, but no other NAND characteristics. Therefore, rename
the minimum write unit to "writesize" for all flashes, including NAND.
Signed-off-by: Joern Engel <joern@wh.fh-wedel.de>
We were scanning for 0xFF through the entire chip -- which takes a while
when it's a 512MiB device as I have on my current toy. The specs only say
we need to check certain bytes -- so do only that.
Signed-off-by: David Woodhouse <dwmw2@infradead.org>
The previous change to read a single byte from oob breaks the
bad block scan on 16 bit devices, when the byte is on an odd
address. Read the complete oob for now.
Remove the unused arguments from check_short_pattern()
Move the wait for ready function so it is only executed when
consecutive reads happen.
Signed-off-by: Thomas Gleixner <tglx@linutronix.de>
Scan 1st and 2nd pages of SP devices for BB marker by default.
Fix more then one page scanning in create_bbt.c.
Signed-off-by: Artem B. Bityuckiy <dedekind@infradead.org>
Signed-off-by: Thomas Gleixner <tglx@linutronix.de>
When scanning NAND for bad blocks, don't read the whole page, read
only needed OOB bytes instead. Also check the return code of the
nand_read_raw() function. Correctly free the this->bbt array in
case of failure. Tested with Large page NAND.
Fix debugging message.
Signed-off-by: Artem B. Bityuckiy <dedekind@infradead.org>
Signed-off-by: Thomas Gleixner <tglx@linutronix.de>
Initial git repository build. I'm not bothering with the full history,
even though we have it. We can create a separate "historical" git
archive of that later if we want to, and in the meantime it's about
3.2GB when imported into git - space that would just make the early
git days unnecessarily complicated, when we don't have a lot of good
infrastructure for it.
Let it rip!
